Evidence of Charged puddles and induced Dephasing in topological insulator thin films

被引：0

作者：

Singh, Sourabh ^{[1
]}

Gopal, R. K. ^{[1
]}

Sarkar, Jit ^{[1
]}

Roy, Subhadip ^{[1
]}

Mitra, Chiranjib ^{[1
]}

机构：

[1] Indian Inst Sci Educ & Res Kolkata, Kolkata, India

来源：

2ND INTERNATIONAL CONFERENCE ON CONDENSED MATTER AND APPLIED PHYSICS (ICC-2017) | 2018年 / 1953卷

关键词：

D O I：

10.1063/1.5032695

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We investigate the dephasing mechanism in bulk insulating topological insulator thin films. The phase coherence length is extracted from magnetoresistance measurements at different temperatures. There is a crossover of the phase coherence length as a function of temperature signifying the role of more than one dephasing mechanism in the system. The dephasing rates have been studied systematically and explained.

引用

页数：3

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