Position-sensitive soft X-ray detectors and their application

被引：0
|
作者：
Goganov, D. A. [1 ]
Kazansky, B. V. [1 ]
Klimenskaya, D. A. [1 ]
Klochkova, I. B. [1 ]
Lebedev, A. G. [1 ]
Lepik, I. P. [1 ]
Pronichev, V. A. [2 ]
Protasov, Y. V. [1 ]
Serebryakov, A. S. [3 ]
机构：
[1] OOO Elion, St Petersburg 191119, Russia
[2] Bourevestnik Res & Prod Enterprise, St Petersburg 195112, Russia
[3] ZAO Komita, St Petersburg 197101, Russia
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2015年 / 58卷 / 01期
关键词：
PROPORTIONAL CHAMBERS; SPATIAL-RESOLUTION; DIFFRACTION; MUSCLE;
D O I：
10.1134/S0020441215010182
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The designs and characteristics of linear and curved position-sensitive gas-filled detectors of soft X rays are described. The best result obtained with a gas mixture based on xenon is near 40 mu m (CuK (alpha)). The information of their use in X-ray scientific equipment is presented.
引用
收藏
页码：107 / 113
页数：7
相关论文
共 50 条
  • [1] Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors
    Honkanen, Ari-Pekka
    Verbeni, Roberto
    Simonelli, Laura
    Sala, Marco Moretti
    Al-Zein, Ali
    Krisch, Michael
    Monaco, Giulio
    Huotari, Simo
    JOURNAL OF SYNCHROTRON RADIATION, 2014, 21 : 762 - 767
  • [2] Status of the FLNP project on neutron position-sensitive detectors
    Belushkin, AV
    Kuzmin, ES
    Shvetsov, VN
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2004, 529 (1-3) : 249 - 253
  • [3] Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors
    Hugh Simons
    John E. Daniels
    Andrew J. Studer
    Jacob L. Jones
    Mark Hoffman
    Journal of Electroceramics, 2014, 32 : 283 - 291
  • [4] Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors
    Simons, Hugh
    Daniels, John E.
    Studer, Andrew J.
    Jones, Jacob L.
    Hoffman, Mark
    JOURNAL OF ELECTROCERAMICS, 2014, 32 (04) : 283 - 291
  • [5] A position-sensitive detector with lithium glass and MaPMT
    Fu Zai-Wei
    Jia Ru
    Heng Yue-Kun
    Qi Ming
    Huang Chang-Hao
    Liu Shu-Lin
    Qian Sen
    Li Shao-Li
    Chen Xiao-Hui
    Liu Shu-Dong
    Lei Xiang-Cui
    Huang Guo-Rui
    CHINESE PHYSICS C, 2012, 36 (11) : 1095 - 1100
  • [6] A position-sensitive detector with lithium glass and MaPMT
    付在伟
    贾茹
    衡月昆
    祁鸣
    黄长浩
    刘术林
    钱森
    李绍莉
    陈晓辉
    刘曙东
    雷祥翠
    黄国瑞
    Chinese Physics C, 2012, (11) : 1095 - 1100
  • [7] Laboratory cryo soft X-ray microscopy
    Hertz, H. M.
    von Hofsten, O.
    Bertilson, M.
    Vogt, U.
    Holmberg, A.
    Reinspach, J.
    Martz, D.
    Selin, M.
    Christakou, A. E.
    Jerlstrom-Hultqvist, J.
    Svard, S.
    JOURNAL OF STRUCTURAL BIOLOGY, 2012, 177 (02) : 267 - 272
  • [8] Chemical Contrast in Soft X-Ray Ptychography
    Beckers, Mike
    Senkbeil, Tobias
    Gorniak, Thomas
    Reese, Michael
    Giewekemeyer, Klaus
    Gleber, Sophie-Charlotte
    Salditt, Tim
    Rosenhahn, Axel
    PHYSICAL REVIEW LETTERS, 2011, 107 (20)
  • [9] Progress toward a Soft X-ray Polarimeter
    Marshall, Herman L.
    Schulz, Norbert S.
    Remlinger, Brian
    Gentry, Eric S.
    Windt, David L.
    Gullikson, Eric M.
    OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VI, 2013, 8861
  • [10] Radiation damage in soft X-ray microscopy
    Wang, J.
    Morin, C.
    Li, L.
    Hitchcock, A. P.
    Scholl, A.
    Doran, A.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2009, 170 (1-3) : 25 - 36
12345