Three-dimensional dispersion of spin waves measured in NiO by resonant inelastic x-ray scattering

被引:23
作者
Betto, D. [1 ]
Peng, Y. Y. [2 ]
Porter, S. B. [3 ,4 ]
Berti, G. [2 ,7 ]
Calloni, A. [2 ]
Ghiringhelli, G. [2 ,5 ,6 ]
Brookes, N. B. [1 ]
机构
[1] European Synchrotron Radiat Facil, 71 Ave Martyrs, Grenoble, France
[2] Politecn Milan, Dipartmento Fis, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
[3] Trinity Coll Dublin, CRANN, Dublin 2, Ireland
[4] Trinity Coll Dublin, AMBER, Dublin 2, Ireland
[5] Politecn Milan, CNR SPIN, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
[6] Politecn Milan, CNISM, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
[7] Max Planck Gesell, Fritz Haber Inst, Dept Chem Phys, Faradayweg 4-6, D-14195 Berlin, Germany
关键词
MAGNETIC-ANISOTROPY MAGNETOSTRICTION; RAMAN-SCATTERING; DOMAIN-WALLS; THIN-FILMS; TEMPERATURE; NEUTRON; GROWTH;
D O I
10.1103/PhysRevB.96.020409
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We used resonant inelastic x-ray scattering (RIXS) at the Ni L-3 edge to measure the dispersion of spin waves in NiO thin films along the [101], [ 001], and [111] directions. Samples with tensile and compressive in-plane strain show identical dispersion within the experimental uncertainty. The fitting of the data with a linear spin wave model applied to a three-dimensional Heisenberg antiferromagnetic lattice provides a leading superexchange parameter J' = 18 meV. The magnon energy at the Brillouin zone boundary and the value of J' are 5% smaller than those determined by inelastic neutron scattering on bulk single crystals. This discrepancy is likely induced by the strain or other structural differences between bulk and epitaxially grown samples. These results demonstrate the capabilities of high-resolution RIXS in the study of the magnetic structure of thin films and heterostructures for which neutron scattering is not sensitive enough.
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页数:5
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