Super-Resolution Enhancement Method Based on Generative Adversarial Network for Integral Imaging Microscopy

被引:10
|
作者
Alam, Md. Shahinur [1 ]
Kwon, Ki-Chul [1 ]
Erdenebat, Munkh-Uchral [1 ]
Y. Abbass, Mohammed [1 ]
Alam, Md. Ashraful [2 ]
Kim, Nam [1 ]
机构
[1] Chungbuk Natl Univ, Dept Comp & Commun Engn, Cheongju 28644, Chungbuk, South Korea
[2] BRAC Univ, Dept Comp Sci & Engn, Dhaka 1212, Bangladesh
基金
新加坡国家研究基金会;
关键词
deep learning; generative adversarial network; integral imaging microscopy; machine intelligence; microscopy; RESOLUTION; DISPLAY; FIELD;
D O I
10.3390/s21062164
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The integral imaging microscopy system provides a three-dimensional visualization of a microscopic object. However, it has a low-resolution problem due to the fundamental limitation of the F-number (the aperture stops) by using micro lens array (MLA) and a poor illumination environment. In this paper, a generative adversarial network (GAN)-based super-resolution algorithm is proposed to enhance the resolution where the directional view image is directly fed as input. In a GAN network, the generator regresses the high-resolution output from the low-resolution input image, whereas the discriminator distinguishes between the original and generated image. In the generator part, we use consecutive residual blocks with the content loss to retrieve the photo-realistic original image. It can restore the edges and enhance the resolution by x2, x4, and even x8 times without seriously hampering the image quality. The model is tested with a variety of low-resolution microscopic sample images and successfully generates high-resolution directional view images with better illumination. The quantitative analysis shows that the proposed model performs better for microscopic images than the existing algorithms.
引用
收藏
页码:1 / 17
页数:17
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