Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool

被引：41

作者：

King, DL ^{[1
]}

Hansen, BR ^{[1
]}

Kratochvil, JA ^{[1
]}

Quintana, MA ^{[1
]}

机构：

[1] Sandia Natl Labs, Albuquerque, NM 87123 USA

来源：

CONFERENCE RECORD OF THE TWENTY SIXTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1997 | 1997年

关键词：

D O I：

10.1109/PVSC.1997.654286

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor, and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses, and proposes their use for process monitoring during manufacturing.

引用

页码：1125 / 1128

页数：4