Focused-helium-ion-beam blow forming of nanostructures: radiation damage and nanofabrication

被引:23
作者
Kim, Chung-Soo [1 ]
Hobbs, Richard G. [2 ,3 ]
Agarwal, Akshay [1 ]
Yang, Yang [4 ]
Manfrinato, Vitor R. [1 ]
Short, Michael P. [4 ]
Li, Ju [4 ,5 ]
Berggren, Karl K. [1 ]
机构
[1] MIT, Res Lab Elect, 77 Massachusetts Ave, Cambridge, MA 02139 USA
[2] Trinity Coll Dublin, Sch Chem, Adv Mat & Bioengn Res Amber Ctr, Dublin, Ireland
[3] Trinity Coll Dublin, CRANN, Dublin, Ireland
[4] MIT, Dept Nucl Sci & Engn, 77 Massachusetts Ave, Cambridge, MA 02139 USA
[5] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
基金
新加坡国家研究基金会; 美国国家科学基金会; 爱尔兰科学基金会;
关键词
focused helium ion beam; diamond; nanofabrication; plastic deformation; ion range; helium nanocavitation; SINGLE-CRYSTAL DIAMOND; IMPLANTATION; ENERGY; NANO; NANOWIRES; GRAPHENE; MICROSTRUCTURE; SUBSURFACE; MECHANISM; JUNCTIONS;
D O I
10.1088/1361-6528/ab4a65
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Targeted irradiation of nanostructures by a finely focused ion beam provides routes to improved control of material modification and understanding of the physics of interactions between ion beams and nanomaterials. Here, we studied radiation damage in crystalline diamond and silicon nanostructures using a focused helium ion beam, with the former exhibiting extremely long-range ion propagation and large plastic deformation in a process visibly analogous to blow forming. We report the dependence of damage morphology on material, geometry, and irradiation conditions (ion dose, ion energy, ion species, and location). We anticipate that our method and findings will not only improve the understanding of radiation damage in isolated nanostructures, but will also support the design of new engineering materials and devices for current and future applications in nanotechnology.
引用
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页数:12
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