Atomic structure of the 3C-SiC(001) surface reconstructions

被引:0
作者
Kitabatake, M
机构
来源
SILICON CARBIDE AND RELATED MATERIALS 1995 | 1996年 / 142卷
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Stable configurations of surface reconstructions of the Si-terminated 3C-SiC(001) surface with additional Si atoms are discussed using the molecular dynamics (MD) simulations. ''Two dimers unit'', in which two additional Si dimers sandwiched between surface Si dimers along the 3C-SiC[110] direction, was derived as the stable surface structure unit. Covering the Si-terminated 3C-SiC(001) surface with the ''Two dimers units'' and a adding the interrupting s-Si dimer rows between the ''Two dimers units'' resulted in the (3x2), (5x2), (7x2), reconstructions whose general expression was ((3+2n)x2). Dangling bond density of these odd number surface reconstructions were expressed as 4+4n/((3+2n)x2).
引用
收藏
页码:421 / 424
页数:4
相关论文
共 50 条
  • [41] Investigation of surface structure related features in the multiple-scattering simulations of photoelectron diffraction of 3C-SiC(001)-c(4 x 2)
    Stoltz, D.
    Stoltz, S. E.
    Widstrand, S. M.
    Johansson, L. S. O.
    PHYSICA B-CONDENSED MATTER, 2007, 395 (1-2) : 130 - 137
  • [42] Hydrogen-induced 3 x 1 phase of the Si-rich 3C-SiC(001) surface
    Yeom, HW
    Matsuda, I
    Chao, YC
    Hara, S
    Yoshida, S
    Uhrberg, RIG
    PHYSICAL REVIEW B, 2000, 61 (04): : R2417 - R2420
  • [43] Epitaxial growth of 3C-SiC on Si(111) and (001) by laser CVD
    Zhu, Peipei
    Yang, Meijun
    Xu, Qingfang
    Sun, Qingyun
    Tu, Rong
    Li, Jun
    Zhang, Song
    Li, Qizhong
    Zhang, Lianmeng
    Goto, Takashi
    Shi, Ji
    Li, Haiwen
    Ohmori, Hitoshi
    Kosinova, Marina
    Basu, Bikramjit
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2018, 101 (09) : 3850 - 3856
  • [44] 3C-SiC growth on (001) Si substrates by using a multilayer buffer
    Canino, Andrea
    Severino, Andrea
    Piluso, Nicolo
    La Via, Francesco
    Privitera, Stefania
    Alberti, Alessandra
    SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 263 - +
  • [45] Atomic and electronic structure of β-SiC(001)-(3 x 2)
    Lu, WC
    Krüger, P
    Pollmann, J
    PHYSICAL REVIEW B, 1999, 60 (04) : 2495 - 2504
  • [46] Characterisation of 3C-SiC crystallites grown on Si (001) by CO annealing
    Krafcsik, OH
    Radnóczi, GZ
    Tóth, L
    Pécz, B
    Deák, P
    MICROSCOPY OF SEMICONDUCTING MATERIALS 2001, 2001, (169): : 189 - 192
  • [47] Defect structures in (001) zincblende GaN/3C-SiC nucleation layers
    Vacek, Petr
    Frentrup, Martin
    Lee, Lok Yi
    Massabuau, Fabien C. P.
    Kappers, Menno J.
    Wallis, David J.
    Groeger, Roman
    Oliver, Rachel A.
    JOURNAL OF APPLIED PHYSICS, 2021, 129 (15)
  • [48] Hetero-epitaxial Growth of 3C-SiC with Smooth Surface on Si(001) using Acetylene Gas
    Hirabayashi, Yasuo
    Kaneko, Satoru
    Akiyama, Kensuke
    SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 247 - 250
  • [49] Angle-resolved inverse photoemission of the (2 x 1)-reconstructed 3C-SiC(001) surface
    Benesch, C
    Merz, H
    Zacharias, H
    SURFACE SCIENCE, 2001, 492 (03) : 225 - 234
  • [50] Nondestructive defect measurement and surface analysis of 3C-SiC on Si (001) by electron channeling contrast imaging
    Picard, Yoosuf N.
    Locke, Christopher
    Frewin, Christopher L.
    Myers-Ward, Rachael L.
    Caldwell, Joshua D.
    Hobart, Karl D.
    Twigg, Mark E.
    Saddow, Stephen E.
    ADVANCES IN GAN, GAAS, SIC AND RELATED ALLOYS ON SILICON SUBSTRATES, 2008, 1068 : 255 - +