Focus introduction: Z-scan technique

被引：8
|
作者：
Yao, Cheng-Bao [1 ]
Zhang, Ke-Xin [1 ]
Wen, Xing [1 ]
机构：
[1] Harbin Normal Univ, Sch Phys & Elect Engn, Key Lab Photon & Elect Bandgap Mat, Minist Educ, Harbin 150025, Peoples R China
来源：
OPTIK | 2017年 / 140卷
基金：
中国国家自然科学基金;
关键词：
Nonlinear optics; Z-scan technique; Sensitivity; Gaussian beam; NONLINEAR REFRACTION MEASUREMENTS; REFLECTION Z-SCAN; TOP-HAT BEAMS; SYSTEM;
D O I：
10.1016/j.ijleo.2017.05.006
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Since the introduction of the Z-scan, which is widely used to measure the nonlinear optical properties of material. The result of measurement mainly depends on light through the sample after a slight variation in the intensity, and the tiny change depends on the accuracy of the measurement sensitivity of Z-scan technology. Measurement scheme of the optical signal for nonlinear characterization and transmission beam design can improve the sensitivity of Z-scan technique. (C) 2017 Elsevier GmbH. All rights reserved.
引用
收藏
页码：680 / 682
页数：3
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