Focus introduction: Z-scan technique

被引：9

作者：

Yao, Cheng-Bao ^{[1
]}

Zhang, Ke-Xin ^{[1
]}

Wen, Xing ^{[1
]}

机构：

[1] Harbin Normal Univ, Sch Phys & Elect Engn, Key Lab Photon & Elect Bandgap Mat, Minist Educ, Harbin 150025, Peoples R China

来源：

OPTIK | 2017年 / 140卷

基金：

中国国家自然科学基金;

关键词：

Nonlinear optics; Z-scan technique; Sensitivity; Gaussian beam; NONLINEAR REFRACTION MEASUREMENTS; REFLECTION Z-SCAN; TOP-HAT BEAMS; SYSTEM;

D O I：

10.1016/j.ijleo.2017.05.006

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Since the introduction of the Z-scan, which is widely used to measure the nonlinear optical properties of material. The result of measurement mainly depends on light through the sample after a slight variation in the intensity, and the tiny change depends on the accuracy of the measurement sensitivity of Z-scan technology. Measurement scheme of the optical signal for nonlinear characterization and transmission beam design can improve the sensitivity of Z-scan technique. (C) 2017 Elsevier GmbH. All rights reserved.

引用

页码：680 / 682

页数：3

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