Carriers temperature for an operating silicon p-n junction

被引:2
作者
Boukhatem, M. H.
El Tahchi, M.
Moussa, G. W. El Haj
Ajaka, M.
Khoury, A.
Mialhe, P.
机构
[1] Univ Perpignan, LP2A, F-66860 Perpignan, France
[2] Univ Libanaise, Fac Sci 2, LPSE, Dept Phys, Jdeidet, Lebanon
关键词
carriers temperature; carriers-lattice interaction; bandgap energy; silicon;
D O I
10.1016/j.mejo.2007.02.002
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An analytic expression is introduced to describe the dependence of the carriers temperature with the lattice temperature. An experimental study of the temperature dependence of silicon junction characteristics leads to an experimental determination of the carriers temperature. An average error of 2.5% between the experimental values and the calculated values is obtained. The introduction of the carriers temperature is used to study the temperature dependence of the energy gap and to determine the value of the energy bandgap at 0 K. The carriers temperature is efficient to use in studying optoelectronic properties of silicon devices. (c) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:615 / 619
页数:5
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