Characterization of Partial Discharge With Polyimide Film in LN2 Considering High Temperature Superconducting Cable Insulation

被引:13
作者
Du, B. X. [1 ]
Xing, Y. Q. [1 ]
Jin, J. X. [2 ]
Blackburn, T. R. [3 ]
Grantham, C. [3 ]
Phung, B. T. [3 ]
Liu, Z. Y. [3 ]
Rahman, M. F. [3 ]
机构
[1] Tianjin Univ, Sch Elect Engn & Automat, Educ Minist, Key Lab Smart Grid, Tianjin 300072, Peoples R China
[2] Univ Elect Sci & Technol China, Ctr Appl Superconduct & Elect Engn, Chengdu 611731, Peoples R China
[3] Univ New S Wales, Sch Elect Engn & Telecommun, Sydney, NSW 2052, Australia
关键词
High temperature superconducting (HTS) cable; polyimide film; void defect; partial discharge; liquid nitrogen; ELECTRICAL INSULATION; LIQUID-HELIUM; VOLTAGE; SYSTEM;
D O I
10.1109/TASC.2014.2349155
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High temperature superconducting (HTS) cable has now reached the stage where their application in power systems is in the process of being implemented. Liquid Nitrogen (LN2) and polyimide film have been used as a coolant and insulation in HTS cable systems. Partial discharge (PD) events may lead to material degradation and total breakdown. PD testing is an important quality check for the insulation of HTS cable. Thus it is necessary to consider PD for the insulation testing in LN2 which is generated in void defects of the insulation layers. The PD characterizations of polyimide film in different defects were investigated under 50 Hz AC voltages in LN2 and at room temperature (298 K). The results show that the number of discharges and the discharge quantity increase with the increasing of the applied voltage and the defect size. The PD inception voltage decreases when the void defect diameter enlarged and it is higher in LN2 than that at room temperature. The maximum field strength for HTS tape insulation increases with the defect close to the tape boundary and the addition of contaminant relative permittivity. Obtained results at cryogenic temperature provide necessary information for insulation design and pre-shipment inspections of HTS cable system.
引用
收藏
页数:5
相关论文
共 30 条
[1]   The Bi-2223 superconducting wires with 200A-class critical current [J].
Ayai, N. ;
Kikuchi, M. ;
Yamazaki, K. ;
Kobayashi, S. ;
Yamade, S. ;
Ueno, E. ;
Fujikami, J. ;
Kato, T. ;
Hayashi, K. ;
Sato, K. ;
Hata, R. ;
Iihara, J. ;
Yamaguchi, K. ;
Shimoyama, J. .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2007, 17 (02) :3075-3078
[2]  
Blackburn TR, 2013, 2013 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD), P241, DOI 10.1109/ASEMD.2013.6780753
[3]   Static and dynamic breakdown characteristics of liquid helium for insulation design of superconducting power equipment [J].
Chigusa, S ;
Hayakawa, N ;
Okubo, H .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2000, 7 (02) :290-295
[4]   Quench-induced dynamic breakdown strength of liquid helium for superconducting coils [J].
Chigusa, S ;
Hayakawa, N ;
Okubo, H .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2000, 10 (01) :1518-1521
[5]   Effect of Nanosecond Rise Time of Pulse Voltage on the Surface Charge of Epoxy/TiO2 Nanocomposites [J].
Du, B. X. ;
Zhang, J. W. ;
Gao, Y. .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2013, 20 (01) :321-328
[6]  
Du B. X., 2012, HIGH VOLTAGE ENG, V38, P336
[7]   Prebreakdown phenomena at high voltage in liquid nitrogen and comparison with mineral oil [J].
Frayssines, PE ;
Lesaint, O ;
Bonifaci, N ;
Denat, A ;
Lelaidier, S ;
Devaux, F .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2002, 9 (06) :899-909
[8]   Partial discharge inception characteristics under butt gap condition in liquid nitrogen/PPLP® composite insulation system for high temperature superconducting cable [J].
Hazeyama, M ;
Kobayashi, T ;
Hayakawa, N ;
Honjo, S ;
Masuda, T ;
Okubo, H .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2002, 9 (06) :939-944
[9]   Electric properties of a 66 kV 3-core superconducting power cable system [J].
Honjo, S ;
Shimodate, M ;
Takahashi, Y ;
Masuda, T ;
Yumura, H ;
Suzawa, C ;
Isojima, S ;
Suzuki, H .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2003, 13 (02) :1952-1955
[10]  
Jin J. X., IEEE T APPL IN PRESS