Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer

被引：31
|
作者：
Inubushi, Yuichi [1 ,2 ]
Inoue, Ichiro [2 ]
Kim, Jangwoo [3 ,4 ]
Nishihara, Akihiko [3 ]
Matsuyama, Satoshi [3 ]
Yumoto, Hirokatsu [1 ,2 ]
Koyama, Takahisa [1 ,2 ]
Tono, Kensuke [1 ,2 ]
Ohashi, Haruhiko [1 ,2 ]
Yamauchi, Kazuto [3 ]
Yabashi, Makina [1 ,2 ]
机构：
[1] Japan Synchrotron Radiat Res Inst, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan
[2] RIKEN, SPring Ctr 8, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan
[3] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, 2-1 Yamada Oka, Suita, Osaka 5650871, Japan
[4] POSTECH, Pohang Accelerator Lab, 127-80 Jigokro, Pohang 37673, Gyeongbuk, South Korea
来源：
APPLIED SCIENCES-BASEL | 2017年 / 7卷 / 06期
关键词：
XFEL; spectroscopy; ultra-shot pulse; ABSORPTION;
D O I：
10.3390/app7060584
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 +/- 1.1 fs.
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页数：5
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