Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer

被引：33

作者：

Inubushi, Yuichi ^{[1
,2
]}

Inoue, Ichiro ^{[2
]}

Kim, Jangwoo ^{[3
,4
]}

Nishihara, Akihiko ^{[3
]}

Matsuyama, Satoshi ^{[3
]}

Yumoto, Hirokatsu ^{[1
,2
]}

Koyama, Takahisa ^{[1
,2
]}

Tono, Kensuke ^{[1
,2
]}

Ohashi, Haruhiko ^{[1
,2
]}

Yamauchi, Kazuto ^{[3
]}

Yabashi, Makina ^{[1
,2
]}

机构：

[1] Japan Synchrotron Radiat Res Inst, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan

[2] RIKEN, SPring Ctr 8, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan

[3] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, 2-1 Yamada Oka, Suita, Osaka 5650871, Japan

[4] POSTECH, Pohang Accelerator Lab, 127-80 Jigokro, Pohang 37673, Gyeongbuk, South Korea

来源：

APPLIED SCIENCES-BASEL | 2017年 / 7卷 / 06期

关键词：

XFEL; spectroscopy; ultra-shot pulse; ABSORPTION;

D O I：

10.3390/app7060584

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 +/- 1.1 fs.

引用

页数：5

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