An in situ resonant photoemission and x-ray absorption study of the BiFeO3 thin film

被引：10

作者：

Ablat, Abduleziz ^{[1
]}

Mamat, Mamatrishat ^{[1
]}

Wu, Rong ^{[1
]}

Ghupur, Yasin ^{[1
]}

Gholam, Turghunjan ^{[1
]}

Muhemmed, Emin ^{[2
]}

Wang, Jiaou ^{[2
]}

Qian, Haijie ^{[2
]}

Wu, Rui ^{[2
]}

Ibrahim, Kurash ^{[2
]}

机构：

[1] Xinjiang Univ, Sch Phys Sci & Technol, Urumqi 830046, Peoples R China

[2] Chinese Acad Sci, Beijing Synchrotron Radiat Facil, Inst High Energy Phys, Beijing 100049, Peoples R China

来源：

CERAMICS INTERNATIONAL | 2016年 / 42卷 / 09期

基金：

中国国家自然科学基金;

关键词：

In situ; Multiferroic; Electronic structure; Resonant photoemission; ELECTRONIC-STRUCTURE; PHOTOELECTRON; SPECTROSCOPY; THRESHOLD;

D O I：

10.1016/j.ceramint.2016.03.157

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Multiferroic bismuth ferrite (BiFeO3) thin films were prepared using the pulsed laser deposition (PLD) technique. The electronic structure of the film was studied in situ using photoemission spectroscopy (PES) and x-ray absorption spectroscopy (XAS). Both the Fe 2p PES and XAS spectra show that the Fe ions were initially in a + 3 valence state. The Fe 2p and O K edge XAS spectra indicate that the oxygen octahedral crystal ligand field divides the unoccupied Fe 3d state into t(2g)down arrow and e(g)down arrow states. Valence band Fe 2p-3d resonant photoemission results indicate that hybridization between Fe 3d and O 2p plays an important role in the multiferroic properties of BiFeO3 thin films. (C) 2016 Elsevier Ltd and Techna Group S.r.l. All rights reserved.

引用

页码：10624 / 10630

页数：7

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