Seeded growth of AlN bulk crystals in m- and c-orientation

被引:142
|
作者
Lu, P. [1 ]
Collazo, R. [1 ]
Dalmau, R. F. [2 ]
Durkaya, G. [3 ]
Dietz, N. [3 ]
Raghothamachar, B. [4 ]
Dudley, M. [4 ]
Sitar, Z. [1 ]
机构
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[2] HexaTech Inc, Morrisville, NC 27560 USA
[3] Georgia State Univ, Dept Phys & Astron, Atlanta, GA 30303 USA
[4] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA
关键词
High resolution X-ray diffraction; Substrates; X-ray topography; Growth from vapor; Seeded vapor growth; Nitrides; SINGLE-CRYSTALS; A-PLANE; PHONONS; RAMAN;
D O I
10.1016/j.jcrysgro.2009.10.008
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Seeded growth of AlN boules was achieved on m-(1 0 (1) over bar 0) and c-(0 0 0 (1) over bar) orientations by physical vapor transport (PVT). The single crystalline m- and c-plane seeds were cut from freestanding AlN single crystals. AlN boules 12 mm in diameter and 7 mm in height were grown at source temperatures around 2280 degrees C in N-2 atmosphere at 500 Torr of total pressure. Under identical process conditions, the m- and c-plane boules exhibited the same growth rates, 150-170 mu m/h, and similar expansion angles, 22-27 degrees, which indicated that the growth was controlled by the thermal profile inside the crucible rather than by crystallographic differences. X-ray rocking curve analysis and Raman spectroscopy confirmed that both m- and c-plane grown crystals possessed high crystalline quality. The dislocation density in both crystals was non-uniform and in the range 10(2)-10(5) cm(-2), as characterized by X-ray topography. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:58 / 63
页数:6
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