HF Gate Drive Circuit for a Normally-On SiC JFET with Inherent Safety
被引:0
作者:
Takuno, Tsuguhiro
论文数: 0引用数: 0
h-index: 0
机构:
Kyoto Univ, Nishikyo Ku, Kyoto, JapanKyoto Univ, Nishikyo Ku, Kyoto, Japan
Takuno, Tsuguhiro
[1
]
Hikihara, Takashi
论文数: 0引用数: 0
h-index: 0
机构:
Kyoto Univ, Nishikyo Ku, Kyoto, JapanKyoto Univ, Nishikyo Ku, Kyoto, Japan
Hikihara, Takashi
[1
]
论文数: 引用数:
h-index:
机构:
Tsuno, Takashi
[2
]
论文数: 引用数:
h-index:
机构:
Hatsukawa, Satoshi
[2
]
机构:
[1] Kyoto Univ, Nishikyo Ku, Kyoto, Japan
[2] Sumitomo Elect Ind Ltd, Kyoto, Japan
来源:
EPE: 2009 13TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS, VOLS 1-9
|
2009年
关键词:
Device application;
High frequency power converter;
High speed drive;
JFET;
New switching devices;
Power semiconductor device;
Power supply;
Safety;
SiC-device;
Silicon Carbide;
D O I:
暂无
中图分类号:
TP301 [理论、方法];
学科分类号:
081202 ;
摘要:
A gate drive circuit for a silicon carbide (Sic) JFET is introduced from the standpoint of application to power conversion circuit. This gate drive circuit enables normally-on JFETs as close as normally-off devices at high switching frequency. The voltage and current responses of the implemented circuit are discussed under loads at the switching frequencies over 1 MHz.