共 45 条
[2]
Alam MA, 2003, 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, P345
[3]
ALAM MA, 2006, MICROELECTR RELIAB
[4]
ALAM MA, 2006, P IRPS
[5]
[Anonymous], 2005, P IRPS
[6]
[Anonymous], 2005, PROC IEEE INT ELECT
[7]
[Anonymous], 2006, 2006 INT C SIM PROC
[9]
A comprehensive framework for predictive modeling of negative bias temperature instability
[J].
2004 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS,
2004,
:273-282
[10]
CHAKRAVARTHI S, 2006, MICROELECTR RELIAB