Effect of SiO2 content on the microstructure, mechanical and dielectric properties of Si3N4 ceramics

被引:42
作者
Lee, Seung Jun [1 ]
Baek, Seungsu [1 ]
机构
[1] Agcy Def Dev, Yuseong POB 35, Daejeon, South Korea
关键词
Si3N4; Sintering additive; Dielectric property; Flexural strength; Si2N2O; SILICON-NITRIDE CERAMICS; HIGH-STRENGTH; ADDITIVES; SI2N2O; DENSE; Y2O3;
D O I
10.1016/j.ceramint.2016.03.092
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This study investigated the effect of SiO2 content in the Y2O3-Al2O3 additive system on the microstructure, mechanical and dielectric properties of silicon nitride (Si3N4) ceramics. The total sintering additive content was fixed at 8 wt% and the amount of SiO2 was varied from 0 to 7 wt%. The crystalline phases of the samples were determined by X-ray diffraction analysis. Complete alpha-to-beta transformation of the Si3N4 occurred during sintering of all of the samples, which indicated that the phase transformation was unaffected by the SiO2 content. However, the microstructures showed that the aspect ratio of the beta-Si3N4 grains decreased and the residual porosity increased with increasing SiO2 content. Additionally, the flexural strength and the dielectric constant decreased with increasing SiO2 content because of the residual porosity and the formation of the Si2N2O phase via a reaction of SiO2 with Si3N4. (C) 2016 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
引用
收藏
页码:9921 / 9925
页数:5
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