Studies on plasma-nitrided iron by scanning electron microscopy, glancing angle x-ray diffraction, and x-ray photoelectron spectroscopy

被引:3
|
作者
Miola, EJ [1 ]
de Souza, SD
Nascente, PAP
Olzon-Dionysio, M
Olivieri, CA
Spinelli, D
机构
[1] Univ Sao Paulo, Escola Engn Sao Carlos, Dept Engn Mat Aeronaut & Automobilist, BR-13560250 Sao Carlos, Brazil
[2] Univ Fed Sao Carlos, Dept Fis, BR-13565905 Sao Carlos, SP, Brazil
[3] Univ Fed Sao Carlos, Ctr Caracterizacao & Desenvolvimento Mat, Dept Mat Engn, BR-13565905 Sao Carlos, SP, Brazil
[4] Univ Fed Sao Carlos, Dept Fis, BR-13565905 Sao Carlos, SP, Brazil
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 2000年 / 18卷 / 06期
关键词
D O I
10.1116/1.1314392
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The tribological and mechanical properties of several iron alloys are improved by nitriding processes. In this work the plasma process was employed because it offers various advantages as compared to other methods used in surface modifications. For example, it is a nonpollutant method and the nitriding times are reduced. Four samples were prepared by nitriding the iron substrates in a gas mixture of 80% of H-2 and 20% of N-2 under a pressure of 900 Pa, discharge frequency of 10 kHz and temperature of 500 degreesC, for 1, 2, 4, and 6 h. The samples were analyzed by optical microscopy, scanning electron microscopy (SEM), microhardness technique, glancing angle x-ray diffraction (GXRD), and x-ray photoelectron spectroscopy (XPS). SEM and GXRD results showed the presence of gamma'-Fe4N and a small amount of epsilon -Fe3N phase. XPS was employed in order to obtain the chemical-state and quantitative informations on the plasma-nitrided iron surfaces. The surface N/Fe atomic ratios obtained by XPS were close to the ideal value of 0.25 for Fe4N. The nitrogen concentration close to the surface is lower than that found in the bulk for all samples. This effect is explained by the presence of H-2 in the gas mixture, which not only cleans the surface but also removes nitrogen by sputtering. (C) 2000 American Vacuum Society. [S0734-2101(00)03306-6].
引用
收藏
页码:2733 / 2737
页数:5
相关论文
共 50 条
  • [1] Surface characterisation of plasma-nitrided iron by X-ray photoelectron spectroscopy
    Miola, EJ
    de Souza, SD
    Nascente, PAP
    Olzon-Dionysio, M
    Olivieri, CA
    Spinelli, D
    APPLIED SURFACE SCIENCE, 1999, 144-45 : 272 - 277
  • [2] Combined x-ray photoelectron Auger electron spectroscopy glancing angle x-ray diffraction extended x-ray absorption fine structure investigation of TiBxNy coatings
    Baker, MA
    Mollart, TP
    Gibson, PN
    Gissler, W
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (02): : 284 - 291
  • [3] AMORPHIZATION OF CERIUM MONONITRIDE DURING OXIDIZATION CHARACTERIZED BY OPTICAL MICROSCOPY, SCANNING ELECTRON MICROSCOPY, X-RAY DIFFRACTION AND X-RAY PHOTOELECTRON SPECTROSCOPY
    Liang, Wei
    Pan, Qifa
    Hu, Yin
    Luo, Lizhu
    Liu, Kezhao
    Zhang, Zhengjun
    SURFACE REVIEW AND LETTERS, 2019, 26 (04)
  • [4] GLANCING-ANGLE X-RAY-DIFFRACTION AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES OF NITROGEN-IMPLANTED TANTALUM
    RAOLE, PM
    NARSALE, AM
    KOTHARI, DC
    PAWAR, PS
    GOGAWALE, SV
    GUZMAN, L
    DAPOR, M
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 115 : 73 - 77
  • [5] Sialolith characterization by scanning electron microscopy and X-ray photoelectron spectroscopy
    Giray, C. Bahadir
    Dogan, Meral
    Akalin, Ayse
    Baltrusaitis, Jonas
    Chan, Daniel C. N.
    Skinner, H. Catherine W.
    Dogan, A. Umran
    SCANNING, 2007, 29 (05) : 206 - 210
  • [6] Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy
    Kim, JN
    Shin, KS
    Park, BO
    Lee, JH
    Kim, NK
    Cho, SH
    SMART MATERIALS & STRUCTURES, 2003, 12 (04): : 565 - 570
  • [7] X-RAY MICROSCOPY AND X-RAY-DIFFRACTION IN SCANNING ELECTRON-MICROSCOPY
    HORN, HF
    EUROPEAN JOURNAL OF CELL BIOLOGY, 1987, 44 : 26 - 26
  • [8] STUDIES OF IRON REDUCTION OF STIBNITE BY X-RAY DIFFRACTION AND SCANNING ELECTRON MICROSCOPY.
    Bose, S.K.
    Altekar, V.A.
    NML Technical Journal (National Metallurgical Laboratory, India), 1982, 24 (1-2): : 5 - 7
  • [9] Atomic force microscopy, X-ray diffraction, X-ray photoelectron spectroscopy and thermal studies of the new melamine fiber
    Rajeev, RS
    De, SK
    Bhowmick, AK
    Gong, B
    Bandyopadhyay, S
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2002, 16 (14) : 1957 - 1978
  • [10] Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
    Unuigbe, David M.
    Harting, Margit
    Jonah, Emmanuel O.
    Britton, David T.
    Nordlund, Dennis
    JOURNAL OF SYNCHROTRON RADIATION, 2017, 24 : 1017 - 1023