Model aluminum-poly(p-phenylenevinylene) interfaces studied by surface Raman Spectroscopy

Polymeric organic light-emitting diodes (OLEDs) have emerged as inexpensive and versatile alternatives to traditional inorganic-based display technologies. Further advances in this field depend on extending device lifetimes and improving electroluminescence efficiencies, both of which are strongly coupled to the integrity of the electrode/organic contacts. Therefore, the deposition of low-work function metals on organic materials has been extensively studied by X-ray photoelectron spectroscopy (XPS), ultraviolet photoemission spectroscopy (UPS), and near-edge X-ray adsorption fine structure (NEXAFS) to ascertain information about the chemical and electronic states within the interfacial region. However, to date, the only molecular structural information about metal-organic species formed in these regions has come from fits of theoretical models to existing XPS and UPS data. Very little direct structural information exists about the potential multitude of metal-organic species formed during cathode deposition. We report the use of surface Raman spectroscopy to study the interactions between aluminum and trans-stilbene, a model for poly(p-phenylenevinylene) (PPV). The Raman spectral data suggest preferential formation of covalent Al-C bonds at the vinylene carbons as opposed to the phenyl carbons of PPV. Copyright © 2003 American Chemical Society.