Microsphere-Assisted Imaging of Periodic and Non-Periodic Structures

被引:3
作者
Zang, Jiaojiao [1 ]
Pei, Yong [1 ]
Yang, Songlin [2 ]
Cao, Yurong [3 ]
Ye, Yong-Hong [3 ]
机构
[1] Nanjing Normal Univ, Sch Phys & Technol, Nanjing 210023, Peoples R China
[2] Southeast Univ, Adv Photon Ctr, Nanjing 210096, Peoples R China
[3] Nanjing Normal Univ, Sch Comp & Elect Informat, Nanjing 210023, Peoples R China
基金
中国国家自然科学基金;
关键词
Nanoparticles; Imaging; Dielectrics; Microscopy; Scanning electron microscopy; Image quality; Substrates; Microsphere; periodic; non-periodic; microscopy; MOVABLE THIN-FILMS; PHYS; BERLIN; 527; SUPERRESOLUTION MICROSCOPY; EVANESCENT WAVES; ARRAYS;
D O I
10.1109/LPT.2022.3155742
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, the difference in imaging small clusters of nanoparticles and hexagonally close packed nanoparticle arrays by microsphere-assisted microscopy is studied. For both high-contrast samples and low-contrast ones, compared with small cluster samples, a better image quality and a larger lateral magnification are observed when imaging periodic array samples. We propose that in imaging periodic samples, the evanescent waves carrying high-frequency information can be converted into propagating waves by shifting the incident wavevectors into different diffraction orders. Therefore, more high-frequency information of the samples can be collected by the imaging system, which results in an improved image quality and a larger magnification when observing periodic array samples.
引用
收藏
页码:341 / 344
页数:4
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