Exchange of Coordinated Solvent During Crystallization of a Metal-Organic Framework Observed by In Situ High-Energy X-ray Diffraction

被引：36

作者：

Wu, Yue ^{[2
]}

Breeze, Matthew I. ^{[1
]}

Clarkson, Guy J. ^{[1
]}

Millange, Franck ^{[3
]}

O'Hare, Dermot ^{[2
]}

Walton, Richard I. ^{[1
]}

机构：

[1] Univ Warwick, Dept Chem, Coventry CV4 7AL, W Midlands, England

[2] Univ Oxford, Dept Chem, Oxford OX1 3TA, England

[3] Univ Versailles St Quentin En Yvelines, Dept Chim, 45 Ave Etats Unis, F-78035 Versailles, France

来源：

ANGEWANDTE CHEMIE-INTERNATIONAL EDITION | 2016年 / 55卷 / 16期

基金：

英国工程与自然科学研究理事会;

关键词：

crystal growth; host-guest systems; metal-organic frameworks; microporous materials; X-ray diffraction; HYDROTHERMAL SYNTHESIS; KINETIC FACTORS; TIME;

D O I：

10.1002/anie.201600896

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Using time-resolved monochromatic high energy X-ray diffraction, we present an in situ study of the solvothermal crystallisation of a new MOF [Yb-2(BDC)(3)(DMF)(2)]H2O (BDC=benzene-1,4-dicarboxylate and DMF=N,N-dimethylformamide) under solvothermal conditions, from mixed water/DMF solvent. Analysis of high resolution powder patterns obtained reveals an evolution of lattice parameters and electron density during the crystallisation process and Rietveld analysis shows that this is due to a gradual topochemical replacement of coordinated solvent molecules. The water initially coordinated to Yb3+ is replaced by DMF as the reaction progresses.

引用

页码：4992 / 4996

页数：5

共 50 条

[21] In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility
Etgens, VH
Alves, MCA
Tadjeddine, A
ELECTROCHIMICA ACTA, 1999, 45 (4-5) : 591 - 599
[22] The structural analysis of manganese borate glass by high-energy X-ray diffraction measurement
Kajinami, A
Kotake, T
Deki, S
Kohara, S
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 199 : 34 - 37
[23] Strain tensor evaluation in polycrystalline materials by scanning high-energy X-ray diffraction
Borbely, Andras
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2020, 53 : 312 - 313
[24] Strains and Stresses in Multilayered Materials Determined Using High-Energy X-ray Diffraction
Geandier, Guillaume
Adenis, Patrick
Selezneff, Serge
d'Andredo, Quentin Pujol
Malard, Benoit
METALS, 2024, 14 (06)
[25] In situ synchrotron x-ray studies of strain and composition evolution during metal-organic chemical vapor deposition of InGaN
Richard, M. -I.
Highland, M. J.
Fister, T. T.
Munkholm, A.
Mei, J.
Streiffer, S. K.
Thompson, Carol
Fuoss, P. H.
Stephenson, G. B.
APPLIED PHYSICS LETTERS, 2010, 96 (05)
[26] In-situ investigation during tempering of a high speed steel with X-ray diffraction
Wiessner, Manfred
Kleber, Siegfried
Kulmburg, Alfred
PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, 2006, 22 (06) : 407 - 417
[27] Design, Synthesis, and X-Ray Crystal Structure of a Fullerene-Linked Metal-Organic Framework
Peng, Ping
Li, Fang-Fang
Neti, Venkata S. Pavan K.
Metta-Magana, Alejandro J.
Echegoyen, Luis
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2014, 53 (01) : 160 - 163
[28] In situ measurement of internal stresses and strain rates by high energy X-Ray diffraction during high temperature mechanical testing
Jacques, A.
Dirand, L.
Chateau, J. P.
Schenk, T.
Ferry, O.
Bastie, P.
EURO SUPERALLOYS 2010, 2011, 278 : 48 - +
[29] Internal strains and stresses measured in cortical bone via high-energy X-ray diffraction
Almer, JD
Stock, SR
JOURNAL OF STRUCTURAL BIOLOGY, 2005, 152 (01) : 14 - 27
[30] X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation
Molodkin, V. B.
Olikhovskii, S. I.
Len, E. G.
Sheludchenko, B. V.
Lizunova, S. V.
Kyslovs'kyy, Ye. M.
Vladimirova, T. P.
Kochelab, E. V.
Reshetnyk, O. V.
Dovganyuk, V. V.
Fodchuk, I. M.
Lytvynchuk, T. V.
Klad'ko, V. P.
Swiatek, Z.
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2011, 208 (11): : 2552 - 2557

← 1 2 3 4 5 →