Dielectric and mechanical behavior of cross-linked polyethylene under thermal aging

被引:0
作者
Mecheri, Y [1 ]
Boukezzi, L [1 ]
Boubakeur, A [1 ]
Lallouani, M [1 ]
机构
[1] Univ Tizi Ouzou, Fac Sci Ingenieur, Dept Electrotech, Tizi Ouzou, Algeria
来源
2000 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, VOLS. I & II | 2000年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper deals with the influence of continuous thermal aging on the dielectric and mechanical properties of Cross-Linked Polyethylene (XLPE) used as electrical insulation in high voltage cables manufactured by ENICAB (Algeria). In order to characterize the degree of the material degradation under thermal aging and to prevent its failure. Continuous accelerated thermal aging tests during 5000 hours on dumb-bells and circular shaped probes of Cross-Linked Polyethylene XLPE UNION CARBIDE 4201 were performed at four levels of temperature ranging from 80 degreesC to 140 degreesC. Some results showing the changes in dielectric losses factor, dielectric constant, resistivity, elongation at fracture and tensile strength with respect to the aging time at the different used aging temperatures are presented. The obtained results show that the thermal aging affects considerably the properties of the material.
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页码:560 / 563
页数:4
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