March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories

被引：6

作者：

Cascaval, P. ^{[1
]}

Cascaval, D. ^{[2
]}

机构：

[1] Gheorghe Asachi Tech Univ Iasi, Dept Comp Sci & Engn, Bd D Mangeron 27, Iasi 700050, Romania

[2] Gheorghe Asachi Tech Univ Iasi, Dept Ind Engn, Bd D Mangeron 27, Iasi 700050, Romania

来源：

MICROELECTRONICS JOURNAL | 2019年 / 93卷

关键词：

Cell coupling - March test algorithms - Memory cell - Memory fault modeling - Neighbourhood - Random access memory - Reduced model;

D O I：

10.1016/j.mejo.2019.104619

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A memory fault model regarding the unlinked static three-cell coupling faults in n x 1 random-access memories is discussed. This model is an extension of the well- known model of unlinked static two-cell coupling faults. Because this model of three-cell coupling is limited to the physically neighbouring memory cells, it can also be considered a neighbourhood pattern-sensitive model. An efficient march test algorithm able to cover this reduced model of three-cell coupling is presented in this letter.

引用

页数：4