Analog and mixed-signal benchmark circuits - First release

被引：121
|
作者：
Kaminska, B
Arabi, K
Bell, I
Goteti, P
Huertas, JL
Kim, B
Rueda, A
Soma, M
机构：
来源：
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年
关键词：
D O I：
10.1109/TEST.1997.639612
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The IEEE Mired-Signal Technical Activity Committee is developing a common set of benchmark circuits for use in researching and evaluating analog fault modeling, test generation, design-for-test, and built-in self-test methodologies. The first release circuits are based on MITEL Semiconductor's 1.5 mu m and 1.2 mu m CMOS technologies and they will allow engineers and researchers working in analog and mixed-signal testing to compare test results as is done in the digital domain. This paper presents a set of typical circuits described by netlists in HSPICE format. Schematic diagrams, simulation results and measured results, if available, are provided together with layout and a typical test environment. The full details are available on the web page dedicated to analog and mixed-signal benchmarks.
引用
收藏
页码：183 / 190
页数：8
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