Analog and mixed-signal benchmark circuits - First release

被引：121

作者：

Kaminska, B

Arabi, K

Bell, I

Goteti, P

Huertas, JL

Kim, B

Rueda, A

Soma, M

机构：

来源：

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年

关键词：

D O I：

10.1109/TEST.1997.639612

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The IEEE Mired-Signal Technical Activity Committee is developing a common set of benchmark circuits for use in researching and evaluating analog fault modeling, test generation, design-for-test, and built-in self-test methodologies. The first release circuits are based on MITEL Semiconductor's 1.5 mu m and 1.2 mu m CMOS technologies and they will allow engineers and researchers working in analog and mixed-signal testing to compare test results as is done in the digital domain. This paper presents a set of typical circuits described by netlists in HSPICE format. Schematic diagrams, simulation results and measured results, if available, are provided together with layout and a typical test environment. The full details are available on the web page dedicated to analog and mixed-signal benchmarks.

引用

页码：183 / 190

页数：8