Determination of global and local residual stresses in SOFC by X-ray diffraction

被引:33
|
作者
Villanova, Julie [1 ,2 ]
Sicardy, Olivier [1 ]
Fortunier, Roland [2 ]
Micha, Jean-Sebastien [3 ]
Bleuet, Pierre [4 ]
机构
[1] CEA Grenoble, LITEN DTH LCPEM, F-38054 Grenoble 9, France
[2] Ecole Mines, Ctr SMS, CNRS, UMR 5146, F-42023 St Etienne 2, France
[3] CEA Grenoble, INAC, UMR5819, SprAM, F-38054 Grenoble 9, France
[4] CEA Grenoble, INAC, SP2M, F-38054 Grenoble 9, France
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2010年 / 268卷 / 3-4期
关键词
SOFC; X-ray diffraction; Stress measurement; Synchrotron radiation; Electrolyte; OXIDE FUEL-CELLS; THERMAL-EXPANSION; ZIRCONIA; ANODES;
D O I
10.1016/j.nimb.2009.09.017
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Solid Oxide Fuel Cell (SOFC) is a high-performance electrochemical device for energy conversion. A single cell is composed of five layers made of different ceramic materials: anode support, anode functional layer, electrolyte, cathode functional layer and cathode. The mechanical integrity of the cell is a major issue during its lifetime, especially for the electrolyte layer. Damage of the cells is mainly due to the high operating temperature, the "redox" behaviour of the anode and the brittleness of the involved materials. Since residual stresses are known to play a significant role in the damage evolution, it is important to determine them. For this purpose, residual stresses in an anode-supported planar SOFC were measured by X-ray diffraction. Firstly, macroscopic stresses in each phase of each layer were studied using the sin(2)psi method on a laboratory X-ray goniometer at room temperature. This technique enables the calculation of residual stress of the material from the measurement of the crystal lattice deformation. The electrolyte has been found under bi-axial compressive stress of -920 MPa. Secondly, X-ray measurements controlling depth penetration were made in the electrolyte using grazing incidence method. The results show that the stress is not homogenous in the layer. The first five micrometers of the electrolyte have been found less constrained (-750 MPa) than the complete layer, suggesting a gradient of deformation in the electrolyte from the interface with the Anode Functional Layer to the free surface. Finally, local stress measurements were made on the electrolyte layer by X-ray synchrotron radiation that allows high accuracy measurement on the (sub-) micrometer scale. Polychromatic and monochromatic beams are used to determine the complete strain tensor from grain to grain in the electrolyte. First results confirm the macroscopic stress trend of the electrolyte. These X-ray techniques at different scales will contribute to a better understanding of the residual stress in the electrolyte layer and thus to the involved damage mechanisms. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:282 / 286
页数:5
相关论文
共 50 条
  • [1] DETERMINATION OF CLAD PLATES RESIDUAL STRESSES BY X-RAY DIFFRACTION METHOD
    Matesa, Branko
    Kozuh, Zoran
    Dunder, Marko
    Samardzic, Ivan
    TEHNICKI VJESNIK-TECHNICAL GAZETTE, 2015, 22 (06): : 1533 - 1538
  • [2] X-ray diffraction method for the determination of residual internal stresses in cement
    Shchukin, ED
    Rybakova, LM
    Kuksenova, LI
    Amelina, EA
    COLLOID JOURNAL, 1997, 59 (01) : 90 - 95
  • [3] Determination of clad plates residual stresses by X-ray diffraction method
    Mateša, Branko
    Kožuh, Zoran
    Dunđer, Marko
    Samardžić, Ivan
    Tehnicki Vjesnik, 2015, 22 (06): : 1533 - 1538
  • [4] DETERMINATION OF LOCAL RESIDUAL-STRESSES FROM X-RAY MEASUREMENTS
    EVENSCHOR, PD
    ZEITSCHRIFT FUR METALLKUNDE, 1982, 73 (06): : 387 - &
  • [5] Determination of Loading and Residual Stresses on Offshore Jacket Structures by X-ray Diffraction
    Schubnell, Jan
    Carl, Eva
    Widerspan, Viktor
    Collmann, Mareike
    JOURNAL OF MARINE SCIENCE AND ENGINEERING, 2023, 11 (07)
  • [6] X-ray and neutron diffraction determination of residual stresses in a pressed and welded component
    Albertini, G
    Bruno, G
    Fiori, F
    Girardin, E
    Giuliani, A
    Quadrini, E
    PHYSICA B, 2000, 276 : 876 - 877
  • [8] X-ray diffraction & residual stresses in ferroelectric cathodes
    Ravi, M.
    Bhat, K. S.
    Krupanidhi, S. B.
    EIGHTH IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE, 2007, : 177 - +
  • [9] X-ray diffraction in thermal treatments: Determination of residual austenite by X-ray diffraction
    Bach, M
    Broll, N
    Cornet, A
    Gaide, L
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 887 - 895
  • [10] X-ray diffraction determination of residual stresses in narrow copper interconnects with submicronic widths
    Sicardy, O
    Touet, I
    Arnaud, L
    Charlet, F
    Berger, T
    ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2000, 347-3 : 562 - 567