Estimation of fatigue damage for an austenitic stainless steel (SUS304) using magnetic methods

被引:0
作者
Oka, M.
Yakushiji, T.
Tsuchida, Y.
Enokizono, M.
机构
[1] Oita Natl Coll Technol, Dept Comp & Control Engn, Oita 8700152, Japan
[2] Oita Natl Coll Technol, Dept Mech Engn, Oita 8700152, Japan
[3] Oita Univ, Fac Engn, Dept Elect & Elect Engn, Oita 8701192, Japan
来源
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 26A AND 26B | 2007年 / 894卷
关键词
martensite; fatigue; remanent magnetization; ECT; SUS304;
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
There are some fatigue damage estimation methods of the austenitic stainless steel that uses the martensitic transformation. For instance, they are the remanent magnetization method, the excitation method, and so on. Those two methods are being researched also in our laboratory now. In the remanent magnetization method, it is well known that the relation between fatigue damage and the remanent magnetization is simple, clear, and reproducible. However, this method has the disadvantage to need a special magnetizer. This method cannot be easily used on the site such as the factory. On the other hand, because the special magnetizer is unnecessary, the excitation method can use easily on the site. The output signal of this method is small. In this paper, two fatigue evaluation methods such as the remanent magnetization method and the excitation method are introduced. In addition, we report on the result of comparing the fatigue evaluation performances of two methods.
引用
收藏
页码:1290 / 1297
页数:8
相关论文
共 7 条
[1]  
Chen ZM, 2002, STUD APPL ELECTROMAG, V23, P127
[2]  
Kai Y, 2004, STUD APPL ELECTROMAG, V24, P153
[3]  
NAKASONE Y, 2001, J JAPAN SOC APPL ELE, V9, P123
[4]  
Oka M, 2006, AIP CONF PROC, V820, P323
[5]  
Oka M, 2003, REV PROG Q, V20, P1387, DOI 10.1063/1.1570293
[6]   Evaluation of a reverse-side defect on stainless steel plates by the residual magnetic field method [J].
Oka, M ;
Enokizono, M .
IEEE TRANSACTIONS ON MAGNETICS, 2001, 37 (04) :3073-3076
[7]  
Uchimoto T, 2004, STUD APPL ELECTROMAG, V24, P159