Implementation of three-dimensional SOI-MEMS wafer-level packaging using through-wafer interconnections

被引:46
作者
Lin, Chiung-Wen [1 ]
Yang, Hsueh-An
Wang, Wei Chung
Fang, Weileun
机构
[1] Natl Tsing Hua Univ, MEMS Inst, Hsinchu 300, Taiwan
[2] Natl Tsing Hua Univ, Power Mech Engn Dept, Hsinchu 300, Taiwan
[3] Adv Semicond Engn, Kaohsiung, Taiwan
关键词
D O I
10.1088/0960-1317/17/6/014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Packaging is an emerging technology for microsystem integration. The silicon- on- insulator ( SOI) wafer has been extensively employed for micromachined devices for its reliable fabrication steps and robust structures. This research reports a packaging approach for silicon- on- insulatormicro- electro- mechanical system ( SOI- MEMS) devices using through- wafer vias and anodic bonding technologies. Through- wafer vias are embedded inside the SOI wafers, and are realized using laser drilling and electroplating. These vias provide electrical signal paths to the MEMS device, while isolating MEMS devices from the outer environment. A high- strength hermetic sealing is then achieved after anodic bonding of the through- wafer- vias- embedded SOI wafer to a Pyrex 7740 glass. Moreover, the packaged SOI- MEMS chip is compatible with surface mount technology, and provides a superior way for 3D heterogeneous integration.
引用
收藏
页码:1200 / 1205
页数:6
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