Total reflection X-ray photoelectron spectroscopy of copper phthalocyanine-gold multilayers

被引：18
作者：
Kawai, J
Amano, H
Hayashi, K
Horiuchi, T
Matsushige, K
Kitajima, Y
机构：
[1] KYOTO UNIV,DEPT ELECT SCI & ENGN,SAKYO KU,KYOTO 60601,JAPAN
[2] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
来源：
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1997年 / 52卷 / 07期
关键词：
surface analysis; surface layer analysis; X-ray photoelectron spectroscopy; X-ray total reflection;
D O I：
10.1016/S0584-8547(96)01646-1
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The total reflection X-ray photoelectron spectra of copper phthalocyanine-gold multilayers on a Si wafer were measured and compared with calculated C1s photoelectron peak intensity. The agreement between experiment and calculation was satisfactory despite the crude model used in the calculation. The island structure of evaporated gold was also observed in the angle dependent C1s photoelectron intensity. (C) 1997 Elsevier Science B.V.
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收藏
页码：873 / 879
页数：7
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