Simultaneous determination of the thickness and optical constants of weakly absorbing thin films

被引：14

作者：

Gauthier-Manuel, B ^{[1
]}

机构：

[1] Univ Franche Comte, UFR Sci & Tech, CNRS,Lab Phys & Metrol Oscillateurs, Grp Pluridisciplinaire Etud Interfaces, F-25030 Besancon, France

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1998年 / 9卷 / 03期

关键词：

D O I：

10.1088/0957-0233/9/3/024

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We show that accurate measurements of transmittance as a function of the wavelength can be used to calculate simultaneously the thickness, real and imaginary parts of the refractive index and dispersion coefficient of thin weakly absorbing plates. We test this method with the characterization of a freshly cleaved mica muscovite sheet.

引用

收藏

页码：485 / 487

页数：3

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