Efficiency optimization of p-type doping in GaN:Mg layers grown by molecular-beam epitaxy

被引:11
作者
Naranjo, FB
Calleja, E
Bougrioua, Z
Trampert, A
Kong, X
Ploog, KH
机构
[1] Univ Politecn Madrid, ETSI Telecommun, ISOM, E-28040 Madrid, Spain
[2] Univ Politecn Madrid, Dept Ingn Elect, E-28040 Madrid, Spain
[3] CNRS, Ctr Rech Heteroepitaxie & Applicat, F-06560 Valbonne, France
[4] Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany
关键词
doping; optical properties; molecular beam epitaxy; nitrides;
D O I
10.1016/j.jcrysgro.2004.07.019
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The Mg-doping efficiency in GaN layers grown by molecular-beam epitaxy has been studied as a function of the growth temperature, the growth rate, and the Mg beam flux. The Mg cell temperature window for efficient p-type doping is rather narrow, being limited by the GaN n-type background doping density (lower limit) and by the Mg surface coverage that, beyond a threshold, induces a layer polarity inversion (N-polarity), leading to a reduction of the Mg incorporation (upper limit). An increase of the growth temperature avoids this polarity inversion, but the Mg flux must be increased to compensate the strong desorption rate. Thus, a trade-off between both temperatures has to be reached. A reduction of the growth rate has a strong effect on the p-type doping level, yielding up to 7 x 10(17) holes/cm(3) for a total Mg concentration of 1 X 10(19) cm(-3). This high Mg concentration does not seem to generate Mg-related defects or deep traps. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:542 / 546
页数:5
相关论文
共 24 条
[1]   Monolithic white light emitting diodes based on InGaN/GaN multiple-quantum wells [J].
Damilano, B ;
Grandjean, N ;
Pernot, C ;
Massies, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (9AB) :L918-L920
[2]  
DAUDIN B, 2000, PHYS STATUS SOLIDI A, V176, P261
[3]   Hall-effect characterization of III-V nitride semiconductors for high efficiency light emitting diodes [J].
Götz, W ;
Kern, RS ;
Chen, CH ;
Liu, H ;
Steigerwald, DA ;
Fletcher, RM .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 59 (1-3) :211-217
[4]   Control of the polarity of GaN films using an Mg adsorption layer [J].
Grandjean, N ;
Dussaigne, A ;
Pezzagna, S ;
Vennéguès, P .
JOURNAL OF CRYSTAL GROWTH, 2003, 251 (1-4) :460-464
[5]   Ultraviolet GaN light-emitting diodes grown by molecular beam epitaxy using NH3 [J].
Grandjean, N ;
Massies, J ;
Leroux, M ;
Lorenzini, P .
APPLIED PHYSICS LETTERS, 1998, 72 (01) :82-84
[6]   Polarity control during molecular beam epitaxy growth of Mg-doped GaN [J].
Green, DS ;
Haus, E ;
Wu, F ;
Chen, L ;
Mishra, UK ;
Speck, JS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04) :1804-1811
[7]   Mg in GaN: Incorporation of a volatile species at high temperatures during molecular beam epitaxy [J].
Guha, S ;
Bojarczuk, NA ;
Cardone, F .
APPLIED PHYSICS LETTERS, 1997, 71 (12) :1685-1687
[8]   The role of growth conditions on the p-doping of GaN by plasma-assisted molecular beam epitaxy [J].
Haus, E ;
Smorchkova, IP ;
Heying, B ;
Fini, P ;
Poblenz, C ;
Mates, T ;
Mishra, UK ;
Speck, JS .
JOURNAL OF CRYSTAL GROWTH, 2002, 246 (1-2) :55-63
[9]   Hole conductivity and compensation in epitaxial GaN:Mg layers [J].
Kaufmann, U ;
Schlotter, P ;
Obloh, H ;
Köhler, K ;
Maier, M .
PHYSICAL REVIEW B, 2000, 62 (16) :10867-10872
[10]   Characterization of Mg-doped GaN grown by metalorganic chemical vapor deposition [J].
Lachab, M ;
Youn, DH ;
Fareed, RSQ ;
Wang, T ;
Sakai, S .
SOLID-STATE ELECTRONICS, 2000, 44 (09) :1669-1677