A Novel 4H-SiC Pinched Barrier Rectifier

被引:0
作者
Ren, Na [1 ]
Wang, Kang L. [1 ]
Zuo, Zheng [2 ]
Li, Ruigang [2 ]
Sheng, Kuang [3 ]
机构
[1] Univ Calif Los Angeles, Los Angeles, CA 90095 USA
[2] AZ Power Inc, Los Angeles, CA USA
[3] Zhejiang Univ, Hangzhou, Zhejiang, Peoples R China
来源
2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC) | 2017年
关键词
Pinched Barrier Rectifier (PBR); Junction Barrier Schottky (JBS); 4H-SiC; SCHOTTKY;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
In this paper, design, fabrication and experimental analysis of a novel 4H-SiC pinched barrier rectifier (PBR) are presented. The operation mechanism of the pinched barrier is analyzed by numerical simulation and energy band diagrams. PN junction depth (X-j) and spacing (S) parameters in the diode structure are carefully designed to achieve a prototype optimal structure, and both forward and reverse characteristics are compared with those of JBS diodes by experimental results. It is demonstrated that, only by simply adjusting the PN junction depth and spacing parameters, the pinched barrier diode can obtain relatively optimal performance close to that of JBS diodes. The addition of channel doping concentration (N-ch) consideration for the structure design can achieve further improvements and superior performances than JBS diodes. In comparison with the optimum JBS diode design (S=1.2 mu m), for an on-set voltage control of 0.8V, PBR diode with optimum design sets of S and Nch can achieve a wider trade-off window (S <= 0.8 mu m) between the device forward and reverse performances. Furthermore, PBR diode can achieve superior performance with lower forward voltage drop (1.3V) than JBS diode (1.6V) for the same reverse blocking capability (similar to 1600V). The performance limit of PBR diode is also explored in this paper. For a minimum limit on-set voltage control of 0.6V, a lowest voltage drop of 1.1V as well as a wide design window can be achieved.
引用
收藏
页码:1950 / 1957
页数:8
相关论文
共 9 条
  • [1] Cai CF, 2013, PROC INT SYMP POWER, P167, DOI 10.1109/ISPSD.2013.6694472
  • [2] Reverse leakage current calculations for SiC Schottky contacts
    Crofton, J
    Sriram, S
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1996, 43 (12) : 2305 - 2307
  • [3] Heinze B, 2008, INT SYM POW SEMICOND, P245
  • [4] Performance and stability of large-area 4H-SiC 10-kV junction barrier Schottky rectifiers
    Hull, Brett A.
    Sumakeris, Joseph J.
    O'Loughlin, Michael J.
    Zhang, Qingchun
    Richmond, Jim
    Powell, Adrian R.
    Imhoff, Eugene A.
    Hobart, Karl D.
    Rivera-Lopez, Angel
    Hefner, Allen R., Jr.
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (08) : 1864 - 1870
  • [5] An Analytical Model With 2-D Effects for 4H-SiC Trenched Junction Barrier Schottky Diodes
    Ren, Na
    Sheng, Kuang
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (12) : 4158 - 4165
  • [6] Design and Experimental Study of 4H-SiC Trenched Junction Barrier Schottky Diodes
    Ren, Na
    Wang, Jue
    Sheng, Kuang
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (07) : 2459 - 2465
  • [7] 1500 V, 4 amp 4H-SiC JBS diodes
    Singh, R
    Ryu, SH
    Palmour, JW
    Hefner, AR
    Lai, JS
    [J]. 12TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS - PROCEEDINGS, 2000, : 101 - 104
  • [8] 4H-SiC Trench Schottky Diodes for Next Generation Products
    Zhang, Qingchun
    Duc, Jennifer
    Mieczkowski, Van
    Hull, Brett
    Allen, Scott
    Palmour, John
    [J]. SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 781 - 784
  • [9] Analytical modeling of high-voltage 4H-SiC junction barrier Schottky (JBS) rectifiers
    Zhu, Lin
    Chow, T. Paul
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (08) : 1857 - 1863