An analysis of Ag/Al2O3 angular selective films by x-ray reflectivity

被引：3

作者：

Dligatch, S ^{[1
]}

Cheary, RW ^{[1
]}

Smith, GB ^{[1
]}

机构：

[1] Univ Technol Sydney, Dept Appl Phys, Sydney, NSW 2007, Australia

来源：

THIN SOLID FILMS | 1998年 / 312卷 / 1-2期

关键词：

X-ray; deposition process; coatings;

D O I：

10.1016/S0040-6090(97)00334-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray reflectivity measurements using a conventional X-ray diffractometer have been carried out on Ag/Al2O3 films prepared by simultaneous bi-oblique deposition of Ag and Al2O3. The results show that this technique is a sensitive way of identifying the presence of a discontinuous 1 nm Ag layer on the surface of the Ag/Al2O3 composite film. (C) 1998 Elsevier Science S.A.

引用

页码：4 / 6

页数：3

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