Future electron devices and SOI technology - Semi-planar SOI MOSFETs with sufficient body effect

被引:30
作者
Hiramoto, T [1 ]
Saito, T [1 ]
Nagumo, T [1 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2003年 / 42卷 / 4B期
关键词
silicon-on-insulator (SOI); body effect factor; short channel effect; FinFET; double gate MOSFET; subthreshold factor; threshold voltage fluctuations;
D O I
10.1143/JJAP.42.1975
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose semi-planar silicon-on-insulator (SOI) metal oxide semiconductor field effect transistors (MOSFETs) in which the short channel effect is suppressed while a sufficient value of the body effect factor is maintained. The sufficient body effect is essential in suppressing the device characteristic fluctuations in the deep sub-100nm regime by adaptive substrate bias control. It is shown that the optimum device design is changed when we take the body effect factor into consideration. As examples of semi-planar SOI MOSFETs, a triangular channel structure and a FinFET structure with low aspect ratio are investigated by simulation and experiment. The short channel effect is suppressed due to a three-dimensionally patterned gate structure and the body effect factor is maintained due to the relatively low aspect ratio of the channel. Simulation and experiment clearly demonstrate the superiority of semi-planar SOI MOSFETs.
引用
收藏
页码:1975 / 1978
页数:4
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