Toward More Efficient Scan Data Bandwidth Utilization on Modern SOCs

被引：0

作者：

Dong, Yan ^{[4
]}

Giles, Grady ^{[1
]}

Li, GuoLiang ^{[2
]}

Rearick, Jeff ^{[3
]}

Schulze, John ^{[1
]}

Wingfield, James ^{[1
]}

Wood, Tim ^{[1
]}

机构：

[1] Adv Micro Devices Inc, Austin, TX USA

[2] Adv Micro Devices Inc, Shanghai, Peoples R China

[3] Adv Micro Devices Inc, Ft Collins, CO USA

[4] Adv Micro Devices Inc, Sunnyvale, CA 94085 USA

来源：

2016 29TH IEEE INTERNATIONAL SYSTEM-ON-CHIP CONFERENCE (SOCC) | 2016年

关键词：

Scan Routing Fabric (SRF); tile; scan bandwidth utilization; Multiple Identical Core Test Access Mechanism (MICTAM); replicant; independent mode;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Modern SOCs may be composed of hundreds of individual physical modules, referred to as tiles. The total number of scan channels servicing these tiles often greatly exceeds the number of SOC device pins available to connect those channels to test equipment. Traditional reliance on a small number of pin-to-channel test mode configurations, predetermined in hardware, results in inefficient scan data bandwidth utilization. Herein is presented a flexible switching network called the Scan Routing Fabric (SRF) which can connect any set of tiles' scan channels to available SOC pins in order to facilitate optimal scheduling of tile patterns by bin-packing algorithms. Other planned improvements to be integrated with the SRF, such as dynamic bandwidth management, MICTAM, and independent mode are also discussed.

引用

页码：64 / 68

页数：5