A virtual dynamic atomic force microscope for image calculations

被引：40

作者：

Polesel-Maris, J ^{[1
]}

Gauthier, S ^{[1
]}

机构：

[1] CNRS, CEMES, GNS, Grp Nanosci ,Ctr Elaborat Mat & Etude Struct, F-31055 Toulouse 4, France

来源：

JOURNAL OF APPLIED PHYSICS | 2005年 / 97卷 / 04期

关键词：

D O I：

10.1063/1.1841462

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Calculations of frequency modulation-atomic force microscopy (FM-AFM) images are presented. A virtual FM-AFM, which realistically simulates the experiment by including the control system of the microscope, is implemented in order to go beyond the usual static approximation. It is shown that the results obtained within the static approach can be recovered in the limit of small scanning speed, while images at realistic scanning speed are distorted. The influence of the experimental noise on the images is investigated, allowing us to evaluate the sensitivity of the instrument. (C) 2005 American Institute of Physics.

引用

页数：6

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