New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

被引：14

作者：

Mugele, F ^{[1
]}

Rettenberger, A ^{[1
]}

Boneberg, J ^{[1
]}

Leiderer, P ^{[1
]}

机构：

[1] Univ Konstanz, Fak Phys, D-78457 Konstanz, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 04期

关键词：

D O I：

10.1063/1.1148839

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse approach is performed with an inertial slider driven by the same piezo tube that is also used for scanning. The performance of the instrument is demonstrated by two different kinds of measurements: First we show topographic images of close packed metal surfaces with atomic resolution. Then, we present results from scanning tunneling spectroscopy measurements on WSe2 under illumination at variable temperatures. (C) 1998 American Institute of Physics. [S0034-6748(98)02004-8].

引用

页码：1765 / 1769

页数：5

共 17 条

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