Waveguide Zeeman interferometry for thin-film chemical sensors

被引：10
|
作者：
Grace, KM
Shrouf, K
Honkanen, S
Ayras, P
Katila, P
Leppihalme, M
Johnston, RG
Yang, X
Swanson, B
Peyghambarian, N
机构：
[1] Univ Calif Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[2] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA
[3] VTT Elect, FIN-02044 VTT, Finland
来源：
ELECTRONICS LETTERS | 1997年 / 33卷 / 19期
关键词：
chemical sensors; optical waveguides; light interferometry;
D O I：
10.1049/el:19971108
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The authors demonstrate a highly sensitive chemical sensor scheme based on Si3N4 channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between thr TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations.
引用
收藏
页码：1651 / 1653
页数：3
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