A concise tutorial review of TOF-SIMS based molecular and cellular imaging

被引：72

作者：

Massonnet, Philippe ^{[1
]}

Heeren, Ron M. A. ^{[1
]}

机构：

[1] Maastricht Univ, Maastricht Multimodal Mol Imaging M4I Inst, Maastricht, Netherlands

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 2019年 / 34卷 / 11期

关键词：

ION MASS-SPECTROMETRY; METAL-ASSISTED SIMS; PRINCIPAL COMPONENT ANALYSIS; ADSORBED PROTEIN FILMS; CLUSTER ION; DESORPTION IONIZATION; SPATIAL-RESOLUTION; SAMPLE PREPARATION; MALDI-MS; LIPIDS;

D O I：

10.1039/c9ja00164f

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined with a signal enhancement method depending on the surface under investigation. The types of detected molecules and methods for molecular identification in SIMS are strongly determined by this combination of ionization method and sample preparation. The use of TOF-SIMS for single cell and three-dimensional imaging will be discussed in the context of selected applications. Finally we will discuss an outlook on the application of the TOF-SIMS technology in a multimodal molecular imaging context.

引用

页码：2217 / 2228

页数：12

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