Analysis and Design Considerations for EMI and Losses of RCD Snubber in Flyback Converter

被引：29

作者：

Meng, Peipei ^{[1
]}

Wu, Xinke ^{[1
]}

Yang, Jianyou ^{[1
]}

Chen, Henglin ^{[1
]}

Qian, Zhaoming ^{[1
]}

机构：

[1] Zhejiang Univ, Coll Elect Engn, Hangzhou 310027, Peoples R China

来源：

2010 TWENTY-FIFTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC) | 2010年

关键词：

D O I：

10.1109/APEC.2010.5433604

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The RCD snubber is usually used in flyback converter, in order to limit the voltage spikes caused by leakage inductance of the transformer. The design considerations of RCD snubber are commonly on the power losses dissipated in the snubber and the voltage spikes of the transistor. In fact, the design of RCD snubber will also affect the EMI performance of the converter. But the RCD design consideration for EMI performance is usually in contradiction with that for losses. In this paper, a detailed model is built up to analyze the voltage spikes, the residual energy and the power losses dissipated in the RCD snubber. And a novel design procedure is derived for selecting the resistor in the RCD circuit to make an optimal tradeoff between CM noises and losses. Experimental results consist well with theoretical analysis.

引用

页码：642 / 647

页数：6

共 18 条

[11] OPTIMUM SNUBBERS FOR POWER SEMICONDUCTORS [J].

MCMURRAY, W .

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 1972, IA 8 (05) :593-&

[12] SELECTION OF SNUBBERS AND CLAMPS TO OPTIMIZE THE DESIGN OF TRANSISTOR SWITCHING CONVERTERS [J].

MCMURRAY, W .

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 1980, 16 (04) :513-523

[13]

PATEL HK, P IEEE ICIEA 2008, P897

[14]

RAHNAMAEE A, P IEEE EPE PEMC 2008, P365

[15]

SCHONBERGER J, MODELLING TURN OFF L, P1

[16]

WANG XC, IEEE APPL POW EL C 2, P706

[17]

Watson ML, 1996, NEPHROL DIAL TRANSPL, V11, P1

[18] Magamp application and limitation for multiwinding flyback converter [J].

Wen, CC ;

Chen, CL .

IEE PROCEEDINGS-ELECTRIC POWER APPLICATIONS, 2005, 152 (03) :517-525

← 1 2 →