Noisy logo recognition using line segment Hausdorff distance

被引：70

作者：

Chen, JY ^{[1
]}

Leung, MK ^{[1
]}

Gao, YS ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sch Comp Engn, Ctr Graph & Imaging Technol, Nanyang 639798, Singapore

来源：

PATTERN RECOGNITION | 2003年 / 36卷 / 04期

关键词：

Hausdorff distance; line; logo matching; shape;

D O I：

10.1016/S0031-3203(02)00128-0

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Logo recognition is of great interest in the document and shape analysis domain. In order to develop a recognition method that is robust to employ under adverse conditions such as different scale/orientation, broken curves, added noise and occlusion, a modified line segment Hausdorff distance is proposed in this paper. The new approach has the advantage to incorporate structural and spatial information to compute dissimilarity between two sets of line segments rather than two sets of points. The proposed technique has been applied on line segments generated from logos with encouraging results. Clear cut distinction between the correct and incorrect matches has been observed. This suggests a strong potential for logo and shape recognition system. (C) 2002 Pattern Recognition Society. Published by Elsevier Science Ltd. All rights reserved.

引用

页码：943 / 955

页数：13

共 20 条

[1]

Cesarini F, 1997, PROC INT CONF DOC, P175, DOI 10.1109/ICDAR.1997.619836

[2]

CESARINI F, 1996, LECT NOTES COMPUTER, V1072, P135

[3] Content-based similarity retrieval of trademarks using relevance feedback [J].

Ciocca, G ;

Schettini, R .

PATTERN RECOGNITION, 2001, 34 (08) :1639-1655

[4] TRADEMARK SHAPES DESCRIPTION BY STRING-MATCHING TECHNIQUES [J].

CORTELAZZO, G ;

MIAN, GA ;

VEZZI, G ;

ZAMPERONI, P .

PATTERN RECOGNITION, 1994, 27 (08) :1005-1018

[5]

DE O, 1999, IEEE T PATTERN ANAL, V21, P1081

[6]

Doermann D, 1996, MACH VISION APPL, V9, P73

[7]

DUBUISSON MP, 1994, INT C PATT RECOG, P566, DOI 10.1109/ICPR.1994.576361

[8]

GAO Y, 2000, THESIS NANYANG TECHN

[9] Line pattern retrieval using relational histograms [J].

Huet, B ;

Hancock, ER .

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1999, 21 (12) :1363-1370

[10] COMPARING IMAGES USING THE HAUSDORFF DISTANCE [J].

HUTTENLOCHER, DP ;

KLANDERMAN, GA ;

RUCKLIDGE, WJ .

IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1993, 15 (09) :850-863

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