Wide field Raman super-resolution microscopy

被引:0
作者
Yan, Shuo [1 ,2 ]
Wang, Mingqun [1 ,2 ]
Fang, Hui [1 ,2 ]
机构
[1] Shenzhen Univ, Nanophoton Res Ctr, Shenzhen 518060, Peoples R China
[2] Shenzhen Univ, Coll Optoelect Engn, Shenzhen 518060, Peoples R China
来源
14TH NATIONAL CONFERENCE ON LASER TECHNOLOGY AND OPTOELECTRONICS (LTO 2019) | 2019年 / 11170卷
关键词
Raman scattering; super resolution; structured illumination microscopy; tunable filter; RESOLUTION LIMIT;
D O I
10.1117/12.2534015
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The appearance of fluorescent probes has greatly promoted the development of optical microscopy, while Raman scattering detection is a further progress attracting more applications of microscopy. However, the research on the wide-field detection and imaging of Raman signals is a challenging project in recent years. We propose a method combining super-resolution structured illumination microscopy (SIM) and the wide-field narrow-bandwidth filtering technique of the tunable filter, using a digital micro mirror device (DMD) to generate structured patterns, and a pair of filters whose cutoff frequency can change as the angle of incidence changes, which allows us to obtain super-resolution images of samples at specific Raman shift peaks. We build up a microscopy system using this method, perform imaging experiments on fluorescent beads of different emission wavelengths and achieve the expected results. In the 3T3 Cell marked with SERS beads imaging experiments, good results are also achieved. We hope that this technology can be applied to more occasions, such as dynamic imaging of biological structures.
引用
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页数:7
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