A bi-prism interferometer for hard X-ray photons

被引：13

作者：

Isakovic, A. F. ^{[1
,4
]}

Stein, A. ^{[1
]}

Warren, J. B. ^{[1
]}

Sandy, A. R. ^{[2
]}

Narayanan, S. ^{[2
]}

Sprung, M. ^{[2
]}

Ablett, M. ^{[1
]}

Siddons, D. P. ^{[1
]}

Metzler, M. ^{[3
]}

Evans-Lutterodt, K. ^{[1
]}

机构：

[1] Brookhaven Natl Lab, Upton, NY 11973 USA

[2] Argonne Natl Lab, Xray Sci Div, Argonne, IL 60439 USA

[3] Cornell NanoScale Sci & Technol Facil, Ithaca, NY 14850 USA

[4] Khalifa Univ Sci Technol & Res, Abu Dhabi, U Arab Emirates

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2010年 / 17卷

关键词：

interferometers; prisms; coherence; REFRACTION; ELECTRON;

D O I：

10.1107/S0909049510012823

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.

引用

页码：451 / 455

页数：5

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