High-Efficiency Air-Stable Colloidal Quantum Dot Solar Cells Based on a Potassium-Doped ZnO Electron-Accepting Layer

被引:30
作者
Azmi, Randi [1 ]
Seo, Gabseok [2 ]
Ahn, Tae Kyu [2 ]
Jang, Sung-Yeon [1 ]
机构
[1] Kookmin Univ, Dept Chem, 77 Jeongneung Ro, Seoul 136702, South Korea
[2] Sungkyunkwan Univ, Dept Energy Sci, 2066 Seobu Ro, Suwon 16419, Gyeonggi Do, South Korea
基金
新加坡国家研究基金会;
关键词
quantum dots solar cells; potassium doped; zinc oxide; fermi level; stability; ZINC-OXIDE; IMPROVED PERFORMANCE; TRANSPORTING LAYER; PHOTOCURRENT;
D O I
10.1021/acsami.8b12577
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
High-efficiency colloidal quantum dot (CQD) solar cells (CQDSCs) with improved air stability were developed by employing potassium-modified ZnO as an electron-accepting layer (EAL). The effective potassium modification was achievable by a simple treatment with a KOH solution of pristine ZnO films prepared by a low-temperature solution process. The resulting K-doped ZnO (ZnO-K) exhibited EAL properties superior to those of a pristine ZnO-EAL. The Fermi energy level of ZnO was upshifted, which increased the internal electric field and amplified the depletion region (i.e., charge drift) of the devices. The surface defects of ZnO were effectively passivated by K modification, which considerably suppressed interfacial charge recombination. The CQDSC based on ZnO-K achieved improved power conversion efficiency (PCE) of approximate to 10.75% (V-OC of 0.67 V, J(SC) of 23.89 mA cm(2), and fill factor of 0.68), whereas the CQDSC based on pristine ZnO showed PCE of 9.97%. Moreover, the suppressed surface defects of ZnO-K substantially improved long-term stability under air. The device using ZnO-K exhibited superior long-term air storage stability (96% retention after 90 days) compared to that using pristine ZnO (88% retention after 90 days). The ZnO-K-based device also exhibited improved photostability under air. Under continuous light illumination for 600 min, the ZnO-K-based device retained 96% of its initial PCE, whereas the pristine ZnO-based device retained only 67%.
引用
收藏
页码:35244 / 35249
页数:6
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