Low-Temperature-Fired ReVO4 (Re = La, Ce) Microwave Dielectric Ceramics

We report a series of ReVO4 (Re=La, Ce) microwave dielectric ceramics fabricated by a standard solid-state reaction method. X-ray diffraction and scanning electron microscopy measurements were performed to explore the phase purity, sintering behavior, and microstructure. The analysis revealed that pure and dense monoclinic LaVO4 ceramics with a monazite structure and tetragonal CeVO4 ceramics with a zircon structure could be obtained in their respective sintering temperature range. Furthermore, LaVO4 and CeVO4 ceramics sintered at 850 degrees C and 950 degrees C for 4h possessed out-bound microwave dielectric properties: epsilon(r)=14.2, Qxf=48197GHz, (f)= -37.9ppm/degrees C, and epsilon(r)=12.3, Qxf=41460GHz, (f)= -34.4ppm/degrees C, respectively. The overall results suggest that the ReVO4 ceramics could be promising materials for low-temperature-cofired ceramic technology.