Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry

被引：44

作者：

Diaz, Ana ^{[2
,3
]}

Mocuta, Cristian ^{[2
]}

Stangl, Julian ^{[3
]}

Keplinger, Mario ^{[3
]}

Weitkamp, Timm ^{[2
]}

Pfeiffer, Franz ^{[1
,4
]}

David, Christian ^{[1
]}

Metzger, Till H. ^{[2
]}

Bauer, Guenther ^{[3
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[3] Johannes Kepler Univ Linz, Inst Solid State Phys & Semicond, A-4040 Linz, Austria

[4] Ecole Polytech Fed Lausanne, CH-1015 Lausanne, Switzerland

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2010年 / 17卷

关键词：

X-rays; coherence; interferometry; wavefront characterization; X-RAY-DIFFRACTION; PERFORMANCE;

D O I：

10.1107/S0909049510004644

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A study of the coherence and wavefront properties of a pseudo-channel-cut monochromator in comparison with a double-crystal monochromator is presented. Using a double-grating interferometer designed for the hard X-ray regime, the complex coherence factor was measured and the wavefront distortions at the sample position were analyzed. A transverse coherence length was found in the vertical direction that was a factor of two larger for the channel-cut monochromator owing to its higher mechanical stability. The wavefront distortions after different optical elements in the beam, such as monochromators and mirrors, were also quantified. This work is particularly relevant for coherent diffraction imaging experiments with synchrotron sources. (C) 2010 International Union of Crystallography Printed in Singapore - all rights reserved

引用

页码：299 / 307

页数：9

共 32 条

[1] Keyhole coherent diffractive imaging
Abbey, Brian
Nugent, Keith A.
Williams, Garth J.
Clark, Jesse N.
Peele, Andrew G.
Pfeifer, Mark A.
De Jonge, Martin
McNulty, Ian
[J]. NATURE PHYSICS, 2008, 4 (05) : 394 - 398
[2] Performance of a cryogenic silicon monochromator under extreme heat load
Chumakov, A
Rüffer, R
Leupold, O
Celse, JP
Martel, K
Rossat, M
Lee, WK
[J]. JOURNAL OF SYNCHROTRON RADIATION, 2004, 11 : 132 - 141
[3] Fabrication of diffraction gratings for hard X-ray phase contrast imaging
David, C.
Bruder, J.
Rohbeck, T.
Gruenzweig, C.
Kottler, C.
Diaz, A.
Bunk, O.
Pfeiffer, F.
[J]. MICROELECTRONIC ENGINEERING, 2007, 84 (5-8) : 1172 - 1177
[4] Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam
Diaz, A.
Mocuta, C.
Stangl, J.
Mandl, B.
David, C.
Vila-Comamala, J.
Chamard, V.
Metzger, T. H.
Bauer, G.
[J]. PHYSICAL REVIEW B, 2009, 79 (12):
[5] X-RAY PHOTON-CORRELATION SPECTROSCOPY STUDY OF BROWNIAN-MOTION OF GOLD COLLOIDS IN GLYCEROL
DIERKER, SB
PINDAK, R
FLEMING, RM
ROBINSON, IK
BERMAN, L
[J]. PHYSICAL REVIEW LETTERS, 1995, 75 (03) : 449 - 452
[6] Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source
Engelhardt, Martin
Baumann, Joachim
Schuster, Manfred
Kottler, Christian
Pfeiffer, Franz
Bunk, Oliver
David, Christian
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (09)
[7] The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays
Guigay, JP
Zabler, S
Cloetens, P
David, C
Mokso, R
Schlenker, M
[J]. JOURNAL OF SYNCHROTRON RADIATION, 2004, 11 : 476 - 482
[8] Observation of heterodyne mixing in surface x-ray photon correlation spectroscopy experiments -: art. no. 076104
Gutt, C
Ghaderi, T
Chamard, V
Madsen, A
Seydel, T
Tolan, M
Sprung, M
Grübel, G
Sinha, SK
[J]. PHYSICAL REVIEW LETTERS, 2003, 91 (07)
[9] Partially wetting thin liquid films: Structure and dynamics studied with coherent x rays
Gutt, C.
Sprung, M.
Fendt, R.
Madsen, A.
Sinha, S. K.
Tolan, M.
[J]. PHYSICAL REVIEW LETTERS, 2007, 99 (09)
[10] Hecht E., 2016, Optics, V5

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