Neutron reflectometry of anionic surfactants on sapphire: A strong maximum in the adsorption near the critical micelle concentration

被引：8

作者：

Li, Ning Ning ^{[1
]}

Thomas, Robert K. ^{[1
]}

Rennie, Adrian R. ^{[2
]}

机构：

[1] Univ Oxford, Dept Chem, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England

[2] Uppsala Univ, Dept Phys & Astron, Box 516, S-75120 Uppsala, Sweden

来源：

JOURNAL OF COLLOID AND INTERFACE SCIENCE | 2016年 / 471卷

关键词：

Surfactant adsorption; Solid-liquid interface; Adsorption maximum; Sodium dodecylsulfate; Neutron reflection; Adsorption isotherm; Charged surface; SODIUM DODECYL-SULFATE; WATER-INTERFACE; GIBBS EQUATION; SURFACES; CHARGE; LIMITATIONS; REFLECTION; COUNTERION; ISOTHERMS; MIXTURES;

D O I：

10.1016/j.jcis.2016.03.014

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The adsorption of the anionic surfactants, lithium, sodium and cesium dodecylsulfates, and sodium decylsulfonate, on the positively charged C-plane (0001) of sapphire (alumina) has been measured using neutron reflection. For each of the four surfactants there is a strong maximum in the adsorption at about the critical micelle concentration. The maximum becomes more marked from lithium to cesium. The measurements were reproduced over a range of different physical conditions and could not be accounted for in terms of impurities. The maximum is explained quantitatively by using the combination of a mass action model to calculate the mean activity of the surfactant, and a cooperative model of the adsorption (Frumkin), in which saturation of the layer is not attained until well above the critical micelle concentration. (C) 2016 Elsevier Inc. All rights reserved.

引用

页码：81 / 88

页数：8

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