Contributed Review: A review of the investigation of rare-earth dopant profiles in optical fibers

被引:10
作者
Sidiroglou, F. [1 ]
Roberts, A. [2 ]
Baxter, G. [1 ]
机构
[1] Victoria Univ, Coll Engn & Sci, Opt Technol Res Lab, POB 14428, Melbourne, Vic 8001, Australia
[2] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia
关键词
ERBIUM-DOPED FIBERS; TOF-SIMS; PREFORMS; AMPLIFIERS; GLASS; MICROSCOPY; DEFECTS; LASER; AMPLIFICATION; OPTIMIZATION;
D O I
10.1063/1.4947066
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Rare-earth doped optical fibers have captivated the interest of many researchers around the world across the past three decades. The growth of this research field has been stimulated primarily through their application in optical communications as fiber lasers and amplifiers, although rare-earth doped optical fiber based devices are now finding important uses in many other scientific and industrial areas (for example, medicine, sensing, the military, and material processing). Such wide commercial interest has provided a strong incentive for innovative fiber designs, alternative glass compositions, and novel fabrication processes. A prerequisite for the ongoing progress of this research field is developing the capacity to provide high resolution information about the rare-earth dopant distribution profiles within the optical fibers. This paper constitutes a comprehensive review of the imaging techniques that have been utilized in the analysis of the distribution of the rare-earth ion erbium within the core of optical fibers. Published by AIP Publishing.
引用
收藏
页数:11
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