Helium ion distributions in a 4 kJ plasma focus device by 1 mm-thick large-size polycarbonate detectors

被引：17

作者：

Sohrabi, M. ^{[1
]}

Habibi, M. ^{[1
]}

Ramezani, V. ^{[1
]}

机构：

[1] Amirkabir Univ Technol, Hlth Phys & Dosimetry Res Lab, Dept Energy Engn & Phys, Tehran, Iran

来源：

PHYSICS LETTERS A | 2014年 / 378卷 / 48期

关键词：

Plasma focus; Helium ions; Tracks; Polycarbonate; 50 Hz-HV generator; Electrochemical etching (ECE); Unaided eyes; Ion profile distributions; NEUTRON-PRODUCTION; 50; HZ; BEAM; EMISSION; TRACKS; ACCELERATION; PF-1000;

D O I：

10.1016/j.physleta.2014.10.024

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Helium ion beam profile, angular and iso-ion beam distributions in 4 kJ Amirkabir plasma focus (APF) device were effectively observed by the unaided eyes and studied in single I mm-thick large-diameter (20 cm) polycarbonate track detectors (PCTD). The PCTDs were processed by 50 Hz-HV electrochemical etching using a large-size ECE chamber. The results show that helium ions produced in the APF device have a ring-shaped angular distribution peaked at an angle of similar to +/- 60 degrees with respect to the top of the anode. Some information on the helium ion energy and distributions is also provided. The method is highly effective for ion beam studies. (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：3631 / 3637

页数：7

共 35 条

[1] Study of lateral spread of ions emitted from 2.3 kJ plasma focus with hydrogen and nitrogen gases [J].