Sources and control of instrumental drift in the surface forces apparatus

被引：13

作者：

Heuberger, M ^{[1
]}

Zäch, M ^{[1
]}

Spencer, ND ^{[1
]}

机构：

[1] ETH Zentrum, Dept Mat, Surface Sci & Technol Lab, CH-8092 Zurich, Switzerland

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 12期

关键词：

D O I：

10.1063/1.1319977

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Instrumental drift in the surface forces apparatus (SFA) has been carefully scrutinized. A diversity of different contributions with different characteristic time constants could be distinguished. The face seal of the functional attachment was identified as a potential weak point in the mechanical loop of the instrument. We compared drift in three different design variants and found that the drift rate may vary over four orders of magnitude. We believe that the presented results are applicable to a number of different SFA types. (C) 2000 American Institute of Physics. [S0034- 6748(00)01112-6].

引用

页码：4502 / 4508

页数：7

共 14 条

[1] Born M., 1986, PRINCIPLES OPTICS
[2] MULTIPLE-BEAM INTERFEROMETRY WITH THIN METAL-FILMS AND UNSYMMETRICAL SYSTEMS
CLARKSON, MT
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1989, 22 (04) : 475 - 482
[3] *DUP, PROP HDB TEFLR PTFE
[4] Use of capacitance to measure surface forces .1. Measuring distance of separation with enhanced spatial and time resolution
Frantz, P
Agrait, N
Salmeron, M
[J]. LANGMUIR, 1996, 12 (13) : 3289 - 3294
[5] Use of capacitance to measure surface forces .2. Application to the study of contact mechanics
Frantz, P
Artsyukhovich, A
Carpick, RW
Salmeron, M
[J]. LANGMUIR, 1997, 13 (22) : 5957 - 5961
[6] HEUBERGER M, UNPUB
[7] THIN-FILM STUDIES USING MULTIPLE-BEAM INTERFEROMETRY
ISRAELAC.JN
[J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1973, 44 (02) : 259 - 272
[8] ISRAELACHVILI JN, 1999, Patent No. 5861954
[9] STEINHILPER W, 1993, VERBINDUNGSELEMENTE
[10] Tolansky S., 1948, MULTIPLE BEAM INTERF

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